Semiconductor Engineering

Automate Memory Test Through A Shared Bus Interface

The use of memory-heavy IP in SoCs for automotive, artificial intelligence (AI), and processor applications is steadily increasing. However, these memory-heavy IP often have only a single access point ...
Business Wire

Teradyne Unveils Magnum 7H - The Next-Generation Memory Tester for High Bandwidth Memory Devices

NORTH READING, Mass.--(BUSINESS WIRE)--Teradyne, Inc. (NASDAQ: TER), a leading provider of automated test equipment and advanced robotics, is proud to announce the launch of the Magnum 7H, a ...
TweakTown

Introspect ships the world's first GDDR7 memory test system, with up to 40Gbps GDDR7

Introspect Technology is a member of JEDEC, the body that covers memory -- including the next-gen GDDR7 memory standard -- with Introspect shipping the world's first GDDR7 memory test system. The just ...
Nasdaq

Advantest Unveils T5801 Ultra-High-Speed Memory Test System to Power Next-Generation DRAM Devices

TOKYO, Feb. 12, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced the T5801 Ultra-High-Speed DRAM Test System. The cutting-edge ...
Semiconductor Engineering

New Error Correcting Code And Non-Volatile Memory Options For Memory BIST

Tessent MemoryBIST from Siemens EDA provides a complete solution for at-speed test, diagnosis, repair, debug and characterization of embedded memories. Leveraging a flexible hierarchical architecture, ...