“Imagine a computation that produces a new bit of information in every step, based on the bits that it has computed so far. Over t steps of time, it may generate up to t new bits of information in ...

Memory test at-speed isn�t easy but can be achieved by balancing test selection, area overhead, and test-time constraints. The semiconductor industry has intensified its focus on yield issues to ...

The original version of this story appeared in Quanta Magazine. One July afternoon in 2024, Ryan Williams set out to prove himself wrong. Two months had passed since he’d hit upon a startling ...

One July afternoon in 2024, Ryan Williams set out to prove himself wrong. Two months had passed since he’d hit upon a startling discovery about the relationship between time and memory in computing.

Tessent MemoryBIST from Siemens EDA provides a complete solution for at-speed test, diagnosis, repair, debug and characterization of embedded memories. Leveraging a flexible hierarchical architecture, ...

Memory test at-speed isn't easy but can be achieved by balancing test selection, area overhead, and test-time constraints. The semiconductor industry has intensified its focus on yield issues to meet ...